Ilan A. Blech: search on Z-Library

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1

Strain relaxation mechanisms of lead and lead alloy thin films on silicon substrates

Masanori Murakami, Tung-Sheng Kuan, Ilan A. Blech

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 511 KB

english, 1982

2

Enhanced X-Ray Diffraction from Substrate Crystals Containing Discontinuous Surface Films

Journal:

Journal of Applied Physics

Year:

1967

Language:

english

File:

PDF, 831 KB

english, 1967

3

Reminiscences About a Chemistry Nobel Prize Won with Metallurgy: Comments on D. Shechtman and I. A. Blech;Metall. Trans. A, 1985, vol. 16A, pp. 1005–12

Ilan A. Blech, John W. Cahn, Denis Gratias

Journal:

Metallurgical and Materials Transactions A

Year:

2012

Language:

english

File:

PDF, 1.90 MB

english, 2012

4

In situ stress measurement of refractory metal silicides during sintering

Pan, J. T., Blech, Ilan

Journal:

Journal of Applied Physics

Year:

1984

Language:

english

File:

PDF, 789 KB

english, 1984

5

High Temperature Camera for X-Ray Topography

Journal:

Review of Scientific Instruments

Year:

1967

Language:

english

File:

PDF, 621 KB

english, 1967

6

[IEEE Fifth Annual Symposium on the Physics of Failure in Electronics - Columbus, OH, USA (1966.11.15-1966.11.17)] Fifth Annual Symposium on the Physics of Failure in Electronics - The Failure of Thin Alluminum Current-Carrying Strips on Oxidized Silicon

Blech, Ilan A., Sello, Harry

Year:

1966

File:

PDF, 6.24 MB

1966

7

X-RAY SURFACE TOPOGRAPHY OF DIFFUSION-GENERATED DISLOCATIONS IN SILICON

Blech, Ilan A., Meieran, Eugene S., Sello, Harry

Journal:

Applied Physics Letters

Year:

1965

Language:

english

File:

PDF, 494 KB

english, 1965

8

Measurement of thermal expansion coefficients of W, WSi, WN, and WSiN thin film metallizations

Lahav, Alex, Grim, Karen A., Blech, Ilan A.

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 659 KB

english, 1990

9

HIGH-TEMPERATURE X-RAY TOPOGRAPHY OF Si WAFERS STRAINED BY THIN SURFACE FILMS

Journal:

Applied Physics Letters

Year:

1966

Language:

english

File:

PDF, 485 KB

english, 1966

10

Linear thermal expansion coefficient and biaxial elastic modulus of diamondlike carbon films

Blech, Ilan A., Wood, Peter

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1993

Language:

english

File:

PDF, 429 KB

english, 1993

11

Erratum: High Temperature X-Ray Topography of Si Wafers Strained by Thin Surface Films

Journal:

Applied Physics Letters

Year:

1967

Language:

english

File:

PDF, 267 KB

english, 1967

12

X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films

Meieran, Eugene S., Blech, Ilan A.

Journal:

Journal of Applied Physics

Year:

1965

Language:

english

File:

PDF, 759 KB

english, 1965

13

X-ray topography of single crystal NiO

Blech, Ilan A., Meieran, Eugene S.

Journal:

Philosophical Magazine

Year:

1966

Language:

english

File:

PDF, 2.46 MB

english, 1966

14

[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Critical length in electromigration-experiments and theory

Year:

1998

Language:

english

File:

PDF, 739 KB

english, 1998